[CC] ZEISS MultiSEM for Large Area Imaging – Pushing the Throughput of Scanning Electron Microscopy

[CC] ZEISS MultiSEM for Large Area Imaging – Pushing the Throughput of Scanning Electron Microscopy

Zeiss

[CC] ZEISS MultiSEM for Large Area Imaging – Pushing the Throughput of Scanning Electron Microscopy

par Zeiss
 
47 people viewed this event.

https://www.zeiss.com/microscopy/int/cmp/ind/20/webinar-series_emea-dach/webinar-zeiss-multisem-the-fastest-electron-microscope-in-the-world.html?&mkt_tok=eyJpIjoiWXpBM1lXWmpZMll3TVRKbSIsInQiOiJlXC9yOWwwanZaNldPUDVjS3hiZlFcL01FRndPZWsreFN0bGF1OGVkMFpUc0NNMjdidFRPeTBUQXhhSTh4MTNXUU5sK2o3NnpreE5vSFwvRTlLc1hTQ29CQXVnbnJlWTdvUDBNeGZFNzZxVmFmSDVaZ3Q3ZHFiMms5RnRYSzhzcWhnYyJ9

Zeiss

Pour s’inscrire à cet évènement, Veuillez vous rendre à l’URL suivante : https://www.zeiss.com/microscopy/int/cmp/ind/20/webinar-series_emea-dach/webinar-zeiss-multisem-the-fastest-electron-microscope-in-the-world.html?&mkt_tok=eyJpIjoiWXpBM1lXWmpZMll3TVRKbSIsInQiOiJlXC9yOWwwanZaNldPUDVjS3hiZlFcL01FRndPZWsreFN0bGF1OGVkMFpUc0NNMjdidFRPeTBUQXhhSTh4MTNXUU5sK2o3NnpreE5vSFwvRTlLc1hTQ29CQXVnbnJlWTdvUDBNeGZFNzZxVmFmSDVaZ3Q3ZHFiMms5RnRYSzhzcWhnYyJ9 →

 

Date And Time

2020-07-01 @ 10:00 to
@ 11:00
 

Lieu

Partout
 

Venue

Zeiss
 

Types d’évènements

microscopie électronique
 

Catégorie de l’évènement

Imabioscope
 
 
 

Share With Friends

Zeiss